Product

Micromanipulated Cryogenic & Vacuum Probe Stations for Chips, Wafers and Device Testing from ~ 3 K to 475 K

Micromanipulated Translation Stages

Four independent X, Y, Z stages provide precise control over the probe motion within the range of travel. Each stage includes graduations in increments of 10 – 12.5 microns, with typical useful resolution of 5 – 6.25 microns. Stages used for microwave probes include theta rotation adjustment for planarization of the probe.

Please click here to download the probe requirement questionnaire (212 KB). The downloaded file will be in PDF format which is viewable and printable with Acrobat Reader, a free plug-in utility from Adobe.

To download the free acrobat plug-in software click here.

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