Cryostats and sample holders for fixed-position probe measurements, Janis Research

Cryostats and Sample Holders
for Fixed-position
Probe Measurements

June 2003

Janis Research Company is now offering sample holders with up to four fixed-position tungsten probes installed for the electrical measurement of samples without the need for permanent contacts. This design is suitable for measurements in temperatures as high as 800 K, and may be ordered wired to the feedthrough type of your choice, including multi-pin, BNC or SMA feedthroughs. Originally designed for DLTS applications, the sample holder is suitable for any kind of measurement where permanent electrical contacts are undesirable.

The photograph below shows a sample holder set up for four-point measurements. A non-electrically conductive mounting surface is provided, and the probes have a limited range of movement for fine-scale positioning when the sample is warm.

This sample holder may be used with any of our standard laboratory cryogenics products, in particular the VPF-800, ST-100 and CCS-450.

Contact Janis today for further details and pricing information.

Model VPF cryostat with sample holder for DLTS applications, cryogenics, Janis Research

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JANIS RESEARCH COMPANY, INC.
2 Jewel Drive, P.O. Box 696
Wilmington, MA 01887-0696 USA
TEL: +1-978-657-8750 FAX: +1-978-658-0349
E-Mail: sales@janis.com
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