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3HELIUM SYSTEMS
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Model HE-3-XGHS Mini-Exchange-Gas
Handling System
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Description:
 The model HE-3-XGHS
mini-exchange-gas handling system is designed to introduce He-3 exchange
gas into the IVC can or the sample chamber of the main He-3 cryostat.
It is typically supplied
for use with the model HE-3-SSXGAS He-3
insert. This compact mini-gas handling system allows complete
control of the amount of He-3 exchange gas used in a very cost effective
manner. The total amount of He-3 exchange gas included in this
mini-exchange gas handling system is typically 1 to 3 STP liters, and is
located in a safe re-usable chamber located on top of the cryostat.
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Table of Contents |
Pages |
 Introduction |
1 |
Standard He-3 Cryostats |
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HE-3-SSV Insert, Standard Sample Loading, Sample in Vacuum |
2 |
HE-3-SVSD Insert, Standard Sample Loading, Sample in Vacuum for He-4 Storage Dewar
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3 |
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HE-3-SSXGAS Insert, Standard Sample Loading, Sample in Exchange Gas |
4 |
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HE-3-XGHS Mini-Exchange-Gas Handling System |
5 |
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HE-3-SOSV Cryostat, Standard Sample Loading, Optical, Sample in Vacuum |
6 |
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HE-3-SOSV-S
Cryostat, Standard Sample Loading, Optical, Sample in Vacuum |
7 |
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HE-3-SVC Cryostat, Standard Sample Loading, Sample in Vacuum, Compact for Detector Application |
8 |
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HE-3-CCR-SSV Cryostat, Standard Sample Loading, Sample in Vacuum, Cryogen-free |
9 |
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HE-3-SSV-CF Cryostat, Standard Sample Loading, Sample in Vacuum, Continuous Flow |
10 |
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HE-3-TLSL Cryostat, Top Loading, Sample in He-3 Liquid |
11 |
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HE-3-TLOSL Cryostat, Top Loading, Optical, Sample in He-3 Liquid |
12 |
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HE-3-TLSV
Cryostat, Top Loading, Sample in Vacuum |
13 |
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Gas Handling System for Top Loading He-3 Systems |
14 |
Special He-3 Cryostats |
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HE-3-TLSL-NMR Cryostat, Top Loading, Sample in He-3 Liquid for NMR Experiments |
15 |
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HE-3-TLSUHV-SPM Cryostat, Top Loading, Sample in UHV for Scanning Probe Microscope System |
16 |
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HE-3-SSUHV-SPM/ESR Cryostat, Standard Sample Loading, Sample in UHV for Scanning Probe Microscope System and Electron Spin Resonance System |
17 |
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HE-3-BLSUHV-STM Cryostat,
Bottom Loading, Sample in UHV for Scanning Tunneling Microscope System
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JANIS RESEARCH COMPANY, INC.
2 Jewel Drive, P.O. Box 696
Wilmington, MA 01887-0696 USA
TEL: +1-978-657-8750 FAX: +1-978-658-0349
E-Mail: sales@janis.com
Policies
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