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Model HE-3-TLSL Cryostat
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Description:
The model HE-3-TLSL cryostat is a
top loading system, designed for fast sample exchange. The
design allows the sample to be removed and inserted directly into the He-3 pot
while the
cryostat is cold. The cryostat includes a sample
probe and a vac-lock system with gate valve for safe sample loading.
This system also includes an external gas handling
system for storing the He-3 gas when the system is warm.
This He-3 cryostat includes
the following components:
- Charcoal sorption pump with
heater and thermometer
- 1 K pot with thermometer
- Top loading sample probe
with vac-lock system
- Thermometer and
heater on
the sample probe
- IVC can
- External gas handling
system with stored He-3 gas
- Operation test
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Options:
- Resistive and/or
superconducting wires
- Coaxial cables
- Fiber optical cables
- IVC tail for
superconducting magnet
- Low eddy current cold
finger
- Vapor cooled helium
dewar
- Liquid nitrogen shielded
dewar
- Automatic temperature
controller
- Superconducting magnet
- Magnet support with high
current leads
- Magnet power supply
- He-3 pot with heater and
thermometer
- Helium level sensor and
read out
- Nitrogen level sensor and
read out
- Liquid helium
transfer line
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Performance Specification:
| Base
Temperature:
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300 mK
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| Holding
Time at Base Temperature:
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24 hours
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| Sample
Space:
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0.5" - 1.0"
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| Temperature Range:
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0.30 K - 80 K
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Table of Contents |
Pages |
 Introduction |
1 |
Standard He-3 Cryostats |
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HE-3-SSV Insert, Standard Sample Loading, Sample in Vacuum |
2 |
HE-3-SVSD Insert, Standard Sample Loading, Sample in Vacuum for He-4 Storage Dewar
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3 |
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HE-3-SSXGAS Insert, Standard Sample Loading, Sample in Exchange Gas |
4 |
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HE-3-XGHS Mini-Exchange-Gas Handling System |
5 |
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HE-3-SOSV Cryostat, Standard Sample Loading, Optical, Sample in Vacuum |
6 |
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HE-3-SOSV-S
Cryostat, Standard Sample Loading, Optical, Sample in Vacuum |
7 |
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HE-3-SVC Cryostat, Standard Sample Loading, Sample in Vacuum, Compact for Detector Application |
8 |
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HE-3-CCR-SSV Cryostat, Standard Sample Loading, Sample in Vacuum, Cryogen-free |
9 |
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HE-3-SSV-CF Cryostat, Standard Sample Loading, Sample in Vacuum, Continuous Flow |
10 |
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HE-3-TLSL Cryostat, Top Loading, Sample in He-3 Liquid |
11 |
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HE-3-TLOSL Cryostat, Top Loading, Optical, Sample in He-3 Liquid |
12 |
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HE-3-TLSV
Cryostat, Top Loading, Sample in Vacuum |
13 |
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Gas Handling System for Top Loading He-3 Systems |
14 |
Special He-3 Cryostats |
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HE-3-TLSL-NMR Cryostat, Top Loading, Sample in He-3 Liquid for NMR Experiments |
15 |
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HE-3-TLSUHV-SPM Cryostat, Top Loading, Sample in UHV for Scanning Probe Microscope System |
16 |
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HE-3-SSUHV-SPM/ESR Cryostat, Standard Sample Loading, Sample in UHV for Scanning Probe Microscope System and Electron Spin Resonance System |
17 |
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HE-3-BLSUHV-STM Cryostat,
Bottom Loading, Sample in UHV for Scanning Tunneling Microscope System
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18 |
JANIS RESEARCH COMPANY, INC.
2 Jewel Drive, P.O. Box 696
Wilmington, MA 01887-0696 USA
TEL: +1-978-657-8750 FAX: +1-978-658-0349
E-Mail: sales@janis.com
Policies
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