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Model HE-3-TLOSL Cryostat
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Description:
The model HE-3-TLOSL cryostat
has both optical access to the sample as well as top loading of the
sample into the cryostat. This
allows the sample to be removed from and introduced into the He-3
chamber, while the cryostat is cold. Optical windows are installed
on the vacuum shroud, the radiation shields, and the He-3 sample chamber.
This permits a light beam to travel through the cryostat vacuum, without
passing through the shielding cryogenics (nitrogen and He-4). The system
includes a sample probe and a vac-lock system with gate valve, plus an
external gas handling system for safe insertion and removal of the
sample in and out of the He-3 chamber.
This He-3 cryostat includes
the following components:
- Charcoal sorption pump with
heater and thermometer
- 1 K pot with thermometer
- Top loading sample probe
with vac-lock system
- Thermometer and
heater on the sample probe
- Optical windows
- External gas handling system
with stored He-3 gas
- Operation test
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Options:
- Resistive and/or
superconducting wires
- Coaxial cables
- Fiber optical cables
- IVC tail for
superconducting magnet
- Low eddy current cold
finger
- Liquid nitrogen shielded dewar
- Automatic temperature
controller
- Superconducting magnet
- Magnet support with high
current leads
- Magnet power supply
- He-3 pot with heater and
thermometer
- Helium level sensor and
read out
- Nitrogen level sensor and
read out
- Liquid helium
transfer line
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Performance Specification:
| Base
Temperature:
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400 mK
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| Holding
Time at Base Temperature:
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24 hours
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| Sample
Space:
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0.5" - 1.0"
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| Temperature Range:
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0.40 K - 80 K
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Table of Contents |
Pages |
Introduction |
1 |
Standard He-3 Cryostats |
HE-3-SSV Insert, Standard Sample Loading, Sample in Vacuum |
2 |
HE-3-SVSD Insert, Standard Sample Loading, Sample in Vacuum for He-4 Storage Dewar
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3 |
HE-3-SSXGAS Insert, Standard Sample Loading, Sample in Exchange Gas |
4 |
HE-3-XGHS Mini-Exchange-Gas Handling System |
5 |
HE-3-SOSV Cryostat, Standard Sample Loading, Optical, Sample in Vacuum |
6 |
HE-3-SOSV-S Cryostat, Standard Sample Loading, Optical, Sample in Vacuum |
7 |
HE-3-SVC Cryostat, Standard Sample Loading, Sample in Vacuum, Compact for Detector Application |
8 |
HE-3-CCR-SSV Cryostat, Standard Sample Loading, Sample in Vacuum, Cryogen-free |
9 |
HE-3-SSV-CF Cryostat, Standard Sample Loading, Sample in Vacuum, Continuous Flow |
10 |
HE-3-TLSL Cryostat, Top Loading, Sample in He-3 Liquid |
11 |
HE-3-TLOSL Cryostat, Top Loading, Optical, Sample in He-3 Liquid |
12 |
HE-3-TLSV
Cryostat, Top Loading, Sample in Vacuum |
13 |
Gas Handling System for Top Loading He-3 Systems |
14 |
Special He-3 Cryostats |
HE-3-TLSL-NMR Cryostat, Top Loading, Sample in He-3 Liquid for NMR Experiments |
15 |
HE-3-TLSUHV-SPM Cryostat, Top Loading, Sample in UHV for Scanning Probe Microscope System |
16 |
HE-3-SSUHV-SPM/ESR Cryostat, Standard Sample Loading, Sample in UHV for Scanning Probe Microscope System and Electron Spin Resonance System |
17 |
HE-3-BLSUHV-STM Cryostat,
Bottom Loading, Sample in UHV for Scanning Tunneling Microscope System
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JANIS RESEARCH COMPANY, INC.
2 Jewel Drive, P.O. Box 696
Wilmington, MA 01887-0696 USA
TEL: +1-978-657-8750 FAX: +1-978-658-0349
E-Mail: sales@janis.com
Policies
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