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Micro-manipulated
Cryogenic & Vacuum Probe
Systems
for Chips, Wafers and Device Testing
from ~3 K to 475 K

LHe/LN2 Cooled Probe Stations
ST-500 Series
The Janis ST-500 series probe stations are high performance research instruments designed to provide affordable vacuum and cryogenic probing of wafers and devices. The proven ST-500 cryostat is the platform for these probe stations, and includes low vibration technology (originally designed for high spatial resolution optical microscopy) to provide outstanding sample positional stability. Researchers around the world are using these systems to conduct research in a wide variety of fields, including MEMS,
nanoscale electronics, superconductivity, ferroelectrics, material sciences, and
optics.
Variable Temperature Cryostat
A cryostat is at the center of every
cryogenic probe station, and Janis has been a world leader in the design and
manufacture of research cryostats for over forty-five years. The
ST-500 cryostat
provides a mechanism for cooling samples efficiently and effectively. The sample
is mounted on a removable sample chuck (holder); sample chucks are available in
a variety of configurations including grounded, coaxial, and triaxial. The
sample is fully surrounded by a thermal shield to minimize radiant sample
heating, resulting in the lowest possible sample temperature. A high efficiency
transfer line is used to provide sample cooling using either LHe or LN2, and
includes an integrated adjustable cryogen flow control valve. Two silicon diode
thermometers and a high wattage heater are used to regulate and monitor the
sample temperature within the broad operating temperature range of 3 K – 475 K.
Optional optical access through the cryostat bottom flange makes transmission
experiments possible.
Please
click here
to download the ST-500 series Probe Station datasheet (228
KB). The
downloaded file will be in PDF format which is viewable and printable
with Acrobat Reader, a free plug-in utility from Adobe.
To download the free acrobat
plug-in software
click
here.
Standard Equipment
- Low vibration model ST-500 cryostat
with integrated vacuum chamber, sample mount, and cooled radiation shield.
- High efficiency LHe/LN2 transfer
line with needle valve flow control.
- Two silicon diode thermometers,
installed at the control heat exchanger and at the sample mount.
- Cartridge heater for temperature
control.
- Cooled radiation shield window.
- Four integrated X-Y-Z probe station
stages with probe support arms, cooled probe holders and LF or MW probes.
- Four edge welded metal bellows to
permit probe translation.
- 10-pin electrical feedthrough.
Optional Equipment
- Monoscope with fiber-optic light
source, vertical boom stand with vertical and horizontal adjustment, CCD
camera, LCD color monitor. Available models include zoom of 7:1, 12.5:1, 16:1.
- Cryogenic temperature controllers
from the leading controller suppliers. Each controller supplied by Janis
includes full integration and testing with the system.
- Turbopump station including 52 L/s
turbomolecular pump, wide range vacuum gauge and readout, stainless steel
flexible pumping line. Available with mechanical or dry diaphragm backing
pump.
- Vibration isolation table, 30” x
30” work surface secured to black anodized frame utilizing pneumatic
isolators.
- Portable ultra-quiet air compressor
for vibration isolation table.
- LN-50 liquid nitrogen storage
dewar, with adapter to match the Janis high efficiency transfer line.
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Specifications |
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Temperature range: |
3 K to 475 K (DC Probes),
3 K to 425 K (MW Probes) (475 K optional) |
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Temperature stability: |
+/- 50 mK |
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Cooldown time: |
~30 min to 10 K, 60 min to 5 K |
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Vibration level: |
+/- 25 nm |
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Positional drift: |
+/- 150 nm in 30 minutes |
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Frequency range: |
DC/LF probe: DC to 10 MHz
Microwave probe: 0-40 GHz, 0-50 GHz, 0-67 GHz |
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Optical access: |
2.0" clear aperture |
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Optical resolution with monoscope: |
7:1 zoom, 4.2 microns
12.5:1 zoom, 3.4 microns
16:1 zoom, 2.2 microns |
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ST-500-1 |
ST-500-2 |
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Maximum sample size: |
42 mm diameter |
52 mm diameter |
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Probe travel: |
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X-axis: |
25 mm |
50 mm |
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Y-axis: |
25 mm
(15 mm with MW Probes) |
40 mm *
(35 mm with MW Probes) |
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Z-axis: |
10 mm |
18 mm |
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Probe translation (incremental units
of graduation): X, Y, Z-axes: |
10 microns |
12.5 microns |
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Probe translation resolution: X, Y,
Z-axes: |
5 microns |
6.25 microns |
* 50 mm including Y-stage pivot.


JANIS RESEARCH COMPANY, INC.
2 Jewel Drive, P.O. Box 696
Wilmington, MA 01887-0696 USA
TEL: +1-978-657-8750 FAX: +1-978-658-0349
E-Mail: sales@janis.com
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