Micro-manipulated
Cryogenic & Vacuum Probe Systems
for Chips, Wafers and Device Testing 
from ~3 K to 475 K

LHe/LN₂ Cooled Probe Stations

Other LHe Cooled Systems

Cryogenic systems include a special model ST-100 continuous flow, variable temperature cryostat system with internal phase separator and multi-helical heat exchanger to ensure full use of the enthalpy of the transferred helium. This offers a high stability ultra low vibration system, when combined with the high efficiency multi-layer super-insulated Janis ST-FHT helium (or nitrogen) transfer line. The line includes a flow control valve that is located at the bottom of the storage dewar for reduced heat load into the flowing cryogen. This permits full operation of the system with the storage dewar at a low pressure of ~1.1 bar, for instantaneous flow control with no circulating pump or other control loop required. The flexibility of the line allows easy bending through a 12" (30 cm) radius without affecting the flow or the efficiency of the transfer. This is typically supplied with an automatic temperature controller (stability of 0.05 K) with IEEE-488 interface & LabView drivers for operation in the temperature range of ~5 K to 325 K (475 K optional). The standard system includes a gold plated OFHC copper sample mount, which accommodates a 25 mm x 25 mm sample. Larger sample sizes (up to 4" or more) are also offered with an added radiation shield window, to intercept the larger radiational heat load on the sample. The cryostat can also be added as an upgrade to vacuum room temperature probe systems.

Mechanical Drawing of Model ST-4KEL-0-CX Probe Station - Top View

Mechanical Drawing of Model ST-4KEL-0-CX Probe Station - Side View

Table of Contents	Pages
Introduction	1
LHe/LN2 Cooled Probe Stations - ST-500 series	2
LHe/LN2 Cooled Probe Stations - other LHe cooled systems	3
Cryogen Free Probe Stations	4
Ultra High Vacuum Probe Stations	5
Vacuum Probe Stations	6
Micromanipulated Translation Stages	7
Probe Options	8